3

Scanning Microscopy for Nanotechnology || Fundamentals of Scanning Electron Microscopy (SEM)

Year:
2006
Language:
english
File:
PDF, 5.64 MB
english, 2006
4

Scanning Microscopy for Nanotechnology ||

Year:
2007
Language:
english
File:
PDF, 113.43 MB
english, 2007
15

An integrated application for voltage sag analysis

Year:
1998
Language:
english
File:
PDF, 701 KB
english, 1998
33

Spontaneous strain in finite size ferroelectrics

Year:
1994
Language:
english
File:
PDF, 355 KB
english, 1994
37

A template-free route to prepare Bi2S3 nanostructures

Year:
2010
Language:
english
File:
PDF, 697 KB
english, 2010
47

A relation between long-range correlation and dielectric anomaly

Year:
1999
Language:
english
File:
PDF, 348 KB
english, 1999